AZSA-AR
Overview
Effortlessly overlay luminescence point images from various microscopes onto CAD data with a streamlined alignment process. With advanced equipotential tracking, Aries enables precise identification of failure locations by analyzing wiring that passes through multiple emission points.
Features
- Experience high-speed display of CAD (design) data, ensuring swift and efficient analysis.
- Seamlessly import image data from various microscopes, complete with XY coordinates and magnification information.
- Automatically align multiple microscope images with a simple and intuitive alignment process.
- Perform simultaneous equipotential tracing by marking multiple emission points, enhancing your defect analysis.
- Highlight equipotential tracing results in distinct colors according to the number of passing luminous points, facilitating quick identification of failure locations.
- Utilize the Data Locator function to share marked location data with other products, such as CAD navigation tools.
- Benefit from the flexibility of a floating license setup.
- Easily identify the same observation position on the electron microscope image as viewed through the microscope.